Numéro
J. Phys. France
Volume 27, Numéro 9-10, septembre-octobre 1966
Page(s) 543 - 548
DOI https://doi.org/10.1051/jphys:01966002709-10054300
J. Phys. France 27, 543-548 (1966)
DOI: 10.1051/jphys:01966002709-10054300

Propriétés optiques des couches minces d'indium

M. Van De Voorde et A. Jones

Centre de Physique Nucléaire, Université de Louvain


Abstract
The optical properties of thin layers of indium have been studied by Burtin [1], Motulevich and Shubin [2]. Their measurements were carried out on samples of unif orm thickness, equal to 0.8 μ and 0.6 μ respectively, and for various wavelengths from, approximately, 1 to 10 microns. Our measurements were based on the reflection and transmission of thin layers of indium of varying thicknesses from 100 to 2000 Å. Measurements were carried out by light transmitted through two filters with pass-bands at about 5 097 and 5 560 Å.


Résumé
Les propriétés optiques des couches minces d'indium ont été étudiées pour deux longueurs d'ondes : 5 097 et 5 560 Å en fonctions de l'épaisseur des couches. Des maximums et minimums apparaissent lorsque l'épaisseur varie de 100 à 2 000 Å.

PACS
7866 - Optical properties of specific thin films.

Key words
films -- indium -- light reflection -- light transmission