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https://doi.org/10.1107/S1600576717010858

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https://doi.org/10.1016/j.actamat.2017.02.067

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https://doi.org/10.1063/1.4905248

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https://doi.org/10.12989/anr.2014.2.1.001

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https://doi.org/10.1080/14786435.2013.778428

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Journal of Physics: Conference Series 281 012017 (2011)
https://doi.org/10.1088/1742-6596/281/1/012017

HRTEM study of defects in twin boundaries of ultra-fine grained copper

M. Sennour, S. Lartigue-Korinek, Y. Champion and M. J. Hÿtch†
Philosophical Magazine 87 (10) 1465 (2007)
https://doi.org/10.1080/14786430601021611

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https://doi.org/10.1016/j.ijplas.2004.04.013

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