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Article cité :

Secondary emission of carbon ions from graphite nanocrystallites

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Quantitative fundamental SIMS studies using 18O implant standards

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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

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Amolecular dynamics simulation of collisional excitation mechanisms in Al

M.H. Shapiro, T.A. Tombrello and J. Fine
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 74 (3) 385 (1993)
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Azimuthal-angle and energy distributions ofAl2+ejected from Al(100) byAr+bombardment

S. A. Larson and L. L. Lauderback
Physical Review B 43 (1) 36 (1991)
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Secondary ion emission. Part II: Testing of the thermodynamic non-equilibrium model of surface ionization

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A molecular dynamics simulation of collisional excitation in sputtering from Al

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Secondary Ion Mass Spectrometry SIMS V

J.-F. Hennequin, R.-L. Inglebert and P. Viaris de Lesegno
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Quantitative analysis using sputtered neutrals in a secondary ion microanalyser

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Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 13 (1-3) 377 (1986)
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R. B. Wright and D. M. Gruen
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A study of the feasibility of a surface plasma influencing secondary ion and photon emission under medium-energy ion bombardment ∗

J.N. Coles
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A study of the energy spectra of secondary ions from metal matrices

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Secondary ion energy spectra of polycrystalline transition metals and aluminium

K.J. Snowdon and R.J. MacDonald
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Achtes Kolloquium über Metallkundliche Analyse mit Besonderer Berücksichtigung der Elektronenstrahl- und Ionenstrahl-Mikroanalyse Wien, 27. bis 29. Oktober 1976

F. G. Rüdenauer
Mikrochimica Acta, Achtes Kolloquium über Metallkundliche Analyse mit Besonderer Berücksichtigung der Elektronenstrahl- und Ionenstrahl-Mikroanalyse Wien, 27. bis 29. Oktober 1976 7 85 (1977)
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Relative ion sputtering yield measurements by integration of secondary ion energy distribution using a retarding-dispersive Ion energy analyzer

A. R. Krauss and D. M. Gruen
Applied Physics 14 (1) 89 (1977)
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Empirical formula for the calculation of secondary ion yields from oxidized metal surfaces and metal oxides

C. Plog, L. Wiedmann and A. Benninghoven
Surface Science 67 (2) 565 (1977)
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Spectres Auger sous bombardement d'ions Ar+ de 60 keV de quelques éléments purs et de composés binaires

Louis Viel, Claude Benazeth and Nicole Benazeth
Surface Science 54 (3) 635 (1976)
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Secondary-ion emission during bombardment of copper and aluminium single crystals with alkali ions

K. Kerkow and M. Trapp
International Journal of Mass Spectrometry and Ion Physics 13 (2) 113 (1974)
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Surface oxidation studies of iron using the static method of secondary ion mass spectrometry (SIMS)

E. Stumpe and A. Benninghoven
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Sur la formation retardée d'ions a l'extérieur d'une cible soumise à un bombardement ionique

M. Bernheim, G. Blaise and G. Slodzian
International Journal of Mass Spectrometry and Ion Physics 10 (3) 293 (1973)
https://doi.org/10.1016/0020-7381(73)83007-4