Journal de Physique

Dynamical screening effects in surface ionization: Application toC60

P. Joyes and R. -J. Tarento
Physical Review B 53 (16) 11242 (1996)
DOI: 10.1103/PhysRevB.53.11242
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Electron and Ion Spectroscopy of Solids

H. W. Werner
Electron and Ion Spectroscopy of Solids 324 (1978)
DOI: 10.1007/978-1-4684-2817-9_8
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Achtes Kolloquium über Metallkundliche Analyse mit Besonderer Berücksichtigung der Elektronenstrahl- und Ionenstrahl-Mikroanalyse Wien, 27. bis 29. Oktober 1976

F. G. Rüdenauer
Mikrochimica Acta, Achtes Kolloquium über Metallkundliche Analyse mit Besonderer Berücksichtigung der Elektronenstrahl- und Ionenstrahl-Mikroanalyse Wien, 27. bis 29. Oktober 1976 7 85 (1977)
DOI: 10.1007/978-3-7091-3724-6_5
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Secondary-ion emission during bombardment of copper and aluminium single crystals with alkali ions

K. Kerkow and M. Trapp
International Journal of Mass Spectrometry and Ion Physics 13 (2) 113 (1974)
DOI: 10.1016/0020-7381(74)80016-1
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Methods of Surface Analysis

J.A. McHUGH
Methods of Surface Analysis 223 (1975)
DOI: 10.1016/B978-0-444-41344-4.50013-6
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The ionic component in the sputtering of metals

V. I. Veksler
Radiation Effects 51 (3-4) 129 (1980)
DOI: 10.1080/00337578008209996
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Alternations in the secondary emission of molecular ions from noble metals

P. Joyes
Journal of Physics and Chemistry of Solids 32 (6) 1269 (1971)
DOI: 10.1016/S0022-3697(71)80184-1
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Formation of multiply charged Al ions by direct recoil

X. Chen, Z. Sroubek and J. A. Yarmoff
Physical Review B 73 (13) 132408 (2006)
DOI: 10.1103/PhysRevB.73.132408
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Discussion of the origin of secondary photon and secondary ion emission during energetic particle irradiation of solids. I. The collision cascade

R. B. Wright and D. M. Gruen
The Journal of Chemical Physics 72 (1) 147 (1980)
DOI: 10.1063/1.438899
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Doubly charged ion emission in sputtering of lanthanum trifluoride

J. Lörinčík, Z. Šroubek and H. Gnaser
Surface Science 314 (3) 373 (1994)
DOI: 10.1016/0039-6028(94)90239-9
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Developments in secondary ion mass spectroscopy and applications to surface studies

A. Benninghoven
Surface Science 53 (1) 596 (1975)
DOI: 10.1016/0039-6028(75)90158-2
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Energy spectra of secondary ions and secondary ion emission (SIE) mechanisms

BA Tsipinyuk and VI Veksler
Vacuum 29 (4-5) 155 (1979)
DOI: 10.1016/S0042-207X(79)80747-2
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The mechanism of excited ion emission

VA Pazdzersky and BA Tsipinyuk
Vacuum 35 (7) 255 (1985)
DOI: 10.1016/0042-207X(85)90598-6
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Condensed Matter

Edward W. Thomas
Condensed Matter 299 (1983)
DOI: 10.1016/B978-0-12-478804-6.50012-5
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The application of nonequilibrium surface ionization to the emission of secondary ions

Z. Jurela
International Journal of Mass Spectrometry and Ion Physics 12 (1) 33 (1973)
DOI: 10.1016/0020-7381(73)80084-1
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Secondary emission of carbon ions from graphite nanocrystallites

K. F. Minnebaev, Yu. A. Ryzhov, I. I. Shkarban and V. E. Yurasova
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques 4 (1) 59 (2010)
DOI: 10.1134/S102745101001009X
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A quantitative test of the kinetic model of secondary ion emission

Robert A. Weller
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 40-41 286 (1989)
DOI: 10.1016/0168-583X(89)90980-4
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Secondary-ion mass spectrometry as a quantitative microanalytical technique

F. Adams, F. Michiels, M. Moens and P. Van Espen
Analytica Chimica Acta 216 25 (1989)
DOI: 10.1016/S0003-2670(00)82003-6
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A molecular dynamics simulation of collisional excitation in sputtering from Al

Mark H. Shapiro and Joseph Fine
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 44 (1) 43 (1989)
DOI: 10.1016/0168-583X(89)90687-3
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A comparative study of methods for thin-film and surface analysis

H W Werner and R P H Garten
Reports on Progress in Physics 47 (3) 221 (1984)
DOI: 10.1088/0034-4885/47/3/001
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Experimental and theoretical approaches to the ionization process in secondary-ion emission

G. Blaise and A. Nourtier
Surface Science 90 (2) 495 (1979)
DOI: 10.1016/0039-6028(79)90358-3
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Energy spectra of ions sputtered from elements by O+2: A comprehensive study

M.A. Rudat and G.H. Morrison
Surface Science 82 (2) 549 (1979)
DOI: 10.1016/0039-6028(79)90211-5
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Inelastic Ion–Surface Collisions

Klaus Wittmaack
Inelastic Ion–Surface Collisions 153 (1977)
DOI: 10.1016/B978-0-12-703550-5.50012-1
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Sur la formation retardée d'ions a l'extérieur d'une cible soumise à un bombardement ionique

M. Bernheim, G. Blaise and G. Slodzian
International Journal of Mass Spectrometry and Ion Physics 10 (3) 293 (1973)
DOI: 10.1016/0020-7381(73)83007-4
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Sur l'écran et les propriétés magnétiques d'une impureté en mouvement au sein d'un métal

B. Djafari-Rouhani, P. Joyes and G. Toulouse
Journal de Physique 34 (8-9) 741 (1973)
DOI: 10.1051/jphys:01973003408-9074100
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A comparison of experimental secondary ion energy spectra of polycrystalline metals with theory

K. J. Snowdon
Radiation Effects 38 (3-4) 141 (1978)
DOI: 10.1080/00337577808233222
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Energy distributions of ions produced by electron-stimulated desorption

Stephen N. Schauer, Robert Thomas and Peter Williams
Surface Science 290 (3) 277 (1993)
DOI: 10.1016/0039-6028(93)90711-R
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A study of the energy spectra of secondary ions from metal matrices

M.A. Rudat and G.H. Morrison
International Journal of Mass Spectrometry and Ion Physics 30 (3-4) 197 (1979)
DOI: 10.1016/0020-7381(79)83001-6
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Amolecular dynamics simulation of collisional excitation mechanisms in Al

M.H. Shapiro, T.A. Tombrello and J. Fine
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 74 (3) 385 (1993)
DOI: 10.1016/0168-583X(93)95969-C
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Theoretical models in secondary ionic emission

P. Joyes
Radiation Effects 19 (4) 235 (1973)
DOI: 10.1080/00337577308232254
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Quantitative analysis using sputtered neutrals in a secondary ion microanalyser

Peter Williams and Lori A. Streit
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 15 (1-6) 159 (1986)
DOI: 10.1016/0168-583X(86)90274-0
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Intrinsic emission of secondary ions from silver-magnesium alloys

J.-F. Hennequin and J.-L. Bernard
Surface Science 234 (1-2) 127 (1990)
DOI: 10.1016/0039-6028(90)90672-U
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Quantitative fundamental SIMS studies using 18O implant standards

Peter Williams, Richard C. Sobers, Klaus Franzreb and Jan Lörinčík
Applied Surface Science 252 (19) 6429 (2006)
DOI: 10.1016/j.apsusc.2006.02.091
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A study of the feasibility of a surface plasma influencing secondary ion and photon emission under medium-energy ion bombardment ∗

J.N. Coles
Surface Science 79 (2) 549 (1979)
DOI: 10.1016/0039-6028(79)90305-4
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Ion-induced Auger-electron emission from aluminum

R. A. Baragiola, E. V. Alonso and H. J. L. Raiti
Physical Review A 25 (4) 1969 (1982)
DOI: 10.1103/PhysRevA.25.1969
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Azimuthal-angle and energy distributions ofAl2+ejected from Al(100) byAr+bombardment

S. A. Larson and L. L. Lauderback
Physical Review B 43 (1) 36 (1991)
DOI: 10.1103/PhysRevB.43.36
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Doubly charged sputtered ions of fourth-row elements

Stephen N. Schauer and Peter Williams
Physical Review B 46 (23) 15452 (1992)
DOI: 10.1103/PhysRevB.46.15452
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Sputtering by Particle Bombardment III

Ming L. Yu
Topics in Applied Physics, Sputtering by Particle Bombardment III 64 91 (1991)
DOI: 10.1007/3540534288_17
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Problem Solving with Microbeam Analysis

Studies in Analytical Chemistry, Problem Solving with Microbeam Analysis 7 173 (1988)
DOI: 10.1016/B978-0-444-98949-9.50018-2
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Surface compositional analysis using low energy ion bombardment induced emission processes

JS Colligon
Vacuum 24 (9) 373 (1974)
DOI: 10.1016/0042-207X(74)92117-4
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Ar+ excited aluminium Auger electron emission from Cu-Al alloys

P.Viaris De Lesegno and J.-F. Hennequin
Surface Science 103 (1) 257 (1981)
DOI: 10.1016/0039-6028(81)90111-4
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A comparison of SIMS with other techniques based on ion-beam solid interactions

HW Werner and PR Boudewijn
Vacuum 34 (1-2) 83 (1984)
DOI: 10.1016/0042-207X(84)90111-8
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Secondary ion and Auger electron emissions from Ar+-ion-sputtered FeAl alloys

J.-F. Hennequin, R.-L. Inglebert and P.Viaris de Lesegno
Surface Science 140 (1) 197 (1984)
DOI: 10.1016/0039-6028(84)90391-1
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Secondary ion energy spectra of polycrystalline transition metals and aluminium

K.J. Snowdon and R.J. MacDonald
International Journal of Mass Spectrometry and Ion Physics 28 (3) 233 (1978)
DOI: 10.1016/0020-7381(78)80089-8
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Quantitative secondary ion mass spectrometry: A review

H. W. Werner
Surface and Interface Analysis 2 (2) 56 (1980)
DOI: 10.1002/sia.740020205
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Theory of the ionization probability for an atom crossing a metal-vacuum surface

P. Joyes and G. Toulouse
Physics Letters A 39 (4) 267 (1972)
DOI: 10.1016/0375-9601(72)90983-8
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Secondary ion emission. Part II: Testing of the thermodynamic non-equilibrium model of surface ionization

Z. Jurela
Radiation Effects and Defects in Solids 108 (2-4) 273 (1989)
DOI: 10.1080/10420158908230316
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The energy spectra of the secondary ion emission for transition metals of the fourth period

VI Veksler
Vacuum 33 (3) 159 (1983)
DOI: 10.1016/0042-207X(83)90006-4
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Ion beam-assisted etching of semiconductors: surface chemistry vs surface physics

Richard B Jackman
Vacuum 44 (3-4) 239 (1993)
DOI: 10.1016/0042-207X(93)90162-4
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Secondary ion emission: the role of the angular resolved energy spectrum

A. Oliva and G. Falcone
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 13 (1-3) 377 (1986)
DOI: 10.1016/0168-583X(86)90532-X
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On the intrinsic secondary ion emission from light metals

Jean-François Hennequin
Surface Science 203 (1-2) 245 (1988)
DOI: 10.1016/0039-6028(88)90207-5
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A model of the ion sputtering process

H.G. Prival
Surface Science 76 (2) 443 (1978)
DOI: 10.1016/0039-6028(78)90107-3
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Quantitative SIMS studies with a uranium matrix

A.E. Morgan and H.W. Werner
Surface Science 65 (2) 687 (1977)
DOI: 10.1016/0039-6028(77)90474-5
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Spectres Auger sous bombardement d'ions Ar+ de 60 keV de quelques éléments purs et de composés binaires

Louis Viel, Claude Benazeth and Nicole Benazeth
Surface Science 54 (3) 635 (1976)
DOI: 10.1016/0039-6028(76)90210-7
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An empirical relationship between atoms and ions sputtered from single crystal surfaces

R.J. MacDonald
Surface Science 43 (2) 653 (1974)
DOI: 10.1016/0039-6028(74)90284-2
Voir cet article

Intrinsic emission of secondary ions from silver-magnesium alloys

J.-F. Hennequin and J.-L. Bernard
Surface Science 235 (2-3) 287 (1990)
DOI: 10.1016/0039-6028(90)90804-H
Voir cet article

Empirical formula for the calculation of secondary ion yields from oxidized metal surfaces and metal oxides

C. Plog, L. Wiedmann and A. Benninghoven
Surface Science 67 (2) 565 (1977)
DOI: 10.1016/0039-6028(77)90015-2
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Model of ionization of atoms sputtered from solids

Z. Šroubek, J. Zavadil, F. Kubec and K. Žďánský
Surface Science 77 (3) 603 (1978)
DOI: 10.1016/0039-6028(78)90144-9
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Auger electron emission by ion bombardment of light metals

J.-F. Hennequin and P.Viaris De Lesegno
Surface Science 42 (1) 50 (1974)
DOI: 10.1016/0039-6028(74)90005-3
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Mass Spectrometry.

A L. Burlingame and G A. Johanson
Analytical Chemistry 44 (5) 337 (1972)
DOI: 10.1021/ac60313a601
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Analytical microscopy by secondary ion imaging techniques

R Castaing and G Slodzian
Journal of Physics E: Scientific Instruments 14 (10) 1119 (1981)
DOI: 10.1088/0022-3735/14/10/002
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Influence of asymmetrical correlations in the secondary emission of solid compounds

P Joyes
Journal of Physics C: Solid State Physics 5 (16) 2192 (1972)
DOI: 10.1088/0022-3719/5/16/020
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Relative ion sputtering yield measurements by integration of secondary ion energy distribution using a retarding-dispersive Ion energy analyzer

A. R. Krauss and D. M. Gruen
Applied Physics 14 (1) 89 (1977)
DOI: 10.1007/BF00882637
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Surface oxidation studies of iron using the static method of secondary ion mass spectrometry (SIMS)

E. Stumpe and A. Benninghoven
Physica Status Solidi (a) 21 (2) 479 (1974)
DOI: 10.1002/pssa.2210210212
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Émission Auger de l'argon lors du bombardement de divers métaux par des ions A+

P. Viaris de Lesegno and J.-F. Hennequin
Journal de Physique 35 (10) 759 (1974)
DOI: 10.1051/jphys:019740035010075900
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Practical Scanning Electron Microscopy

J. W. Colby
Practical Scanning Electron Microscopy 529 (1975)
DOI: 10.1007/978-1-4613-4422-3_14
Voir cet article

Secondary Ion Mass Spectrometry SIMS V

J.-F. Hennequin, R.-L. Inglebert and P. Viaris de Lesegno
Springer Series in Chemical Physics, Secondary Ion Mass Spectrometry SIMS V 44 60 (1986)
DOI: 10.1007/978-3-642-82724-2_13
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Material Characterization Using Ion Beams

G. Blaise
Material Characterization Using Ion Beams 143 (1978)
DOI: 10.1007/978-1-4684-0856-0_6
Voir cet article

H. W. Werner and P. R. Boudewijn
5 355 (2002)
DOI: 10.1007/0-306-46914-6_5
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Article cité par

Article cité :

Theoretical study of secondary ion emissionÉtude théorique de l'émission ionique secondaire

Citations de cet article :

Dynamical screening effects in surface ionization: Application toC60

Electron and Ion Spectroscopy of Solids

Achtes Kolloquium über Metallkundliche Analyse mit Besonderer Berücksichtigung der Elektronenstrahl- und Ionenstrahl-Mikroanalyse Wien, 27. bis 29. Oktober 1976

Secondary-ion emission during bombardment of copper and aluminium single crystals with alkali ions

Methods of Surface Analysis

The ionic component in the sputtering of metals

Alternations in the secondary emission of molecular ions from noble metals

Formation of multiply charged Al ions by direct recoil

Discussion of the origin of secondary photon and secondary ion emission during energetic particle irradiation of solids. I. The collision cascade

Doubly charged ion emission in sputtering of lanthanum trifluoride

Developments in secondary ion mass spectroscopy and applications to surface studies

Energy spectra of secondary ions and secondary ion emission (SIE) mechanisms

The mechanism of excited ion emission

Condensed Matter

The application of nonequilibrium surface ionization to the emission of secondary ions

Secondary emission of carbon ions from graphite nanocrystallites

A quantitative test of the kinetic model of secondary ion emission

Secondary-ion mass spectrometry as a quantitative microanalytical technique

A molecular dynamics simulation of collisional excitation in sputtering from Al

A comparative study of methods for thin-film and surface analysis

Experimental and theoretical approaches to the ionization process in secondary-ion emission

Energy spectra of ions sputtered from elements by O+2: A comprehensive study

Inelastic Ion–Surface Collisions

Sur la formation retardée d'ions a l'extérieur d'une cible soumise à un bombardement ionique

Sur l'écran et les propriétés magnétiques d'une impureté en mouvement au sein d'un métal

A comparison of experimental secondary ion energy spectra of polycrystalline metals with theory

Energy distributions of ions produced by electron-stimulated desorption

A study of the energy spectra of secondary ions from metal matrices

Amolecular dynamics simulation of collisional excitation mechanisms in Al

Theoretical models in secondary ionic emission

Quantitative analysis using sputtered neutrals in a secondary ion microanalyser

Intrinsic emission of secondary ions from silver-magnesium alloys

Quantitative fundamental SIMS studies using 18O implant standards

A study of the feasibility of a surface plasma influencing secondary ion and photon emission under medium-energy ion bombardment ∗

Ion-induced Auger-electron emission from aluminum

Azimuthal-angle and energy distributions ofAl2+ejected from Al(100) byAr+bombardment

Doubly charged sputtered ions of fourth-row elements

Sputtering by Particle Bombardment III

Problem Solving with Microbeam Analysis

Surface compositional analysis using low energy ion bombardment induced emission processes

Ar+ excited aluminium Auger electron emission from Cu-Al alloys

A comparison of SIMS with other techniques based on ion-beam solid interactions

Secondary ion and Auger electron emissions from Ar+-ion-sputtered FeAl alloys

Secondary ion energy spectra of polycrystalline transition metals and aluminium

Quantitative secondary ion mass spectrometry: A review

Theory of the ionization probability for an atom crossing a metal-vacuum surface

Secondary ion emission. Part II: Testing of the thermodynamic non-equilibrium model of surface ionization

The energy spectra of the secondary ion emission for transition metals of the fourth period

Ion beam-assisted etching of semiconductors: surface chemistry vs surface physics

Secondary ion emission: the role of the angular resolved energy spectrum

On the intrinsic secondary ion emission from light metals

A model of the ion sputtering process

Quantitative SIMS studies with a uranium matrix

Spectres Auger sous bombardement d'ions Ar+ de 60 keV de quelques éléments purs et de composés binaires

An empirical relationship between atoms and ions sputtered from single crystal surfaces

Intrinsic emission of secondary ions from silver-magnesium alloys

Empirical formula for the calculation of secondary ion yields from oxidized metal surfaces and metal oxides

Model of ionization of atoms sputtered from solids

Auger electron emission by ion bombardment of light metals

Mass Spectrometry.

Analytical microscopy by secondary ion imaging techniques

Influence of asymmetrical correlations in the secondary emission of solid compounds

Relative ion sputtering yield measurements by integration of secondary ion energy distribution using a retarding-dispersive Ion energy analyzer

Surface oxidation studies of iron using the static method of secondary ion mass spectrometry (SIMS)

Émission Auger de l'argon lors du bombardement de divers métaux par des ions A+

Practical Scanning Electron Microscopy

Secondary Ion Mass Spectrometry SIMS V

Material Characterization Using Ion Beams

Theoretical study of secondary ion emission
Étude théorique de l'émission ionique secondaire