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Multiple-charged secondary-ion emission from silicon and silicon oxide bombarded by heavy ions at energies of 0.4–10 MeV

S. Kyoh, K. Takakuwa, M. Sakura, et al.
Physical Review A 51 (1) 554 (1995)
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Determination of the concentration and stable isotopic composition of nonexchangeable hydrogen in organic matter

Arndt. Schimmelmann
Analytical Chemistry 63 (21) 2456 (1991)
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A quantitative test of the kinetic model of secondary ion emission

Robert A. Weller
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 40-41 286 (1989)
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Vaporization Thermodynamics and Molecular Sputtering of Binary Targets

Dieter M. Gruen, Patricia A. Finn and Dennis L. Page
Nuclear Technology 29 (3) 309 (1976)
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Ion beam energy filtering by focal separation

J.-F. Hennequin
International Journal of Mass Spectrometry and Ion Physics 19 (4) 419 (1976)
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Quantitative surface analysis of organic polymer blends using a time-of-flight static secondary ion mass spectrometer

Patrick M. Thompson
Analytical Chemistry 63 (21) 2447 (1991)
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Material Characterization Using Ion Beams

G. Blaise
Material Characterization Using Ion Beams 143 (1978)
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Dependence of the energy distribution on the emission angle for the secondary ions from polycrystalline aluminum

K. Komori and J. Okano
International Journal of Mass Spectrometry and Ion Physics 27 (4) 379 (1978)
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STM study of sputter-deposited Al clusters in chemical interaction with graphite (0001) surfaces

V. Maurice and P. Marcus
Surface Science 275 (1-2) 65 (1992)
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Ion—ion emission — A new tool for mass-spectrometric investigations of processes on the surface and in the bulk of solids

Ya.M. Fogel'
International Journal of Mass Spectrometry and Ion Physics 9 (2) 109 (1972)
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Design of a combined ion and electron microprobe apparatus

Helmut Liebl
International Journal of Mass Spectrometry and Ion Physics 6 (5-6) 401 (1971)
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Implications in the use of secondary ion mass spectrometry to investigate impurity concentration profiles in solids

F. Schulz, K. Wittmaack and J. Maul
Radiation Effects 18 (3-4) 211 (1973)
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Energy and mass distributions of sputtered particles

A.R. Krauss and R.B. Wright
Journal of Nuclear Materials 89 (2-3) 229 (1980)
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Average energy of sputtered ions from fifteen polycrystalline targets

Z. Jurela
International Journal of Mass Spectrometry and Ion Physics 18 (2) 101 (1975)
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Design and performance of quadrupole-based SIMS instruments: a critical review

Klaus Wittmaack
Vacuum 32 (2) 65 (1982)
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Theoretical models in secondary ionic emission

P. Joyes
Radiation Effects 19 (4) 235 (1973)
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The energy spectra of secondary ions emitted during ion bombardment

A. R. Bayly and R. J. Macdonald
Radiation Effects 34 (4) 169 (1977)
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Take-off angle dependence of secondary ion signal intensity

V Fesič and M Veselý
Vacuum 45 (5) 627 (1994)
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Secondary ion emission: the role of the angular resolved energy spectrum

A. Oliva and G. Falcone
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 13 (1-3) 377 (1986)
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On the kinetic energies of sputtered excited particles, I. Atoms sputtered from Li, LiF, and NaCl

Steven Dzioba, Orlando Auciello and Roger Kelly
Radiation Effects 45 (3-4) 235 (1980)
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A low background secondary ion mass spectrometer with quadrupole analyser

K. Wittmaack, J. Maul and F. Schulz
International Journal of Mass Spectrometry and Ion Physics 11 (1) 23 (1973)
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Secondary-ion emission during bombardment of copper and aluminium single crystals with alkali ions

K. Kerkow and M. Trapp
International Journal of Mass Spectrometry and Ion Physics 13 (2) 113 (1974)
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Inelastic Ion–Surface Collisions

Klaus Wittmaack
Inelastic Ion–Surface Collisions 153 (1977)
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Energy spectra of ions sputtered from elements by O+2: A comprehensive study

M.A. Rudat and G.H. Morrison
Surface Science 82 (2) 549 (1979)
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A comparison of secondary ion emission from polycrystalline metals under MeV and keV heavy ion bombardment

John P. O'Connor, Patricia G. Blauner and Robert A. Weller
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 7-8 768 (1985)
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Critical investigation of the secondary ion emission of pure metals using the pseudoatom method

J. Antal and S. Kugler
Acta Physica Academiae Scientiarum Hungaricae 49 (4) 351 (1980)
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Quantitative ion implantation: The practice

W.H. Gries
International Journal of Mass Spectrometry and Ion Physics 30 (2) 113 (1979)
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Energy distribution of secondary ions from 15 polycrystalline targets

Z. Jurela
Radiation Effects 19 (3) 175 (1973)
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Energy spectra of secondary ions and secondary ion emission (SIE) mechanisms

BA Tsipinyuk and VI Veksler
Vacuum 29 (4-5) 155 (1979)
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Sputtering by Particle Bombardment III

Ming L. Yu
Topics in Applied Physics, Sputtering by Particle Bombardment III 64 91 (1991)
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Processus de formation d'ions à partir d'atomes éjectés dans des états électroniques surexcités lors du bombardement ionique des métaux de transition

G. Blaise and G. Slodzian
Journal de Physique 31 (1) 93 (1970)
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Secondary ion energy spectra of polycrystalline transition metals and aluminium

K.J. Snowdon and R.J. MacDonald
International Journal of Mass Spectrometry and Ion Physics 28 (3) 233 (1978)
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Experimental and theoretical approaches to the ionization process in secondary-ion emission

G. Blaise and A. Nourtier
Surface Science 90 (2) 495 (1979)
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Energy dependence of the secondary ion yield of metals and semiconductors

K. Wittmaack
Surface Science 53 (1) 626 (1975)
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Energies of Cu1+ ions sputtered from Cu by very low energy (50 eV < E < 1 keV) Inert gas ions

Robert G. Hart and C.Burleigh Cooper
Surface Science 94 (1) 105 (1980)
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The ionic component in the sputtering of metals

V. I. Veksler
Radiation Effects 51 (3-4) 129 (1980)
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Secondary ion emission from silicon and silicon oxide

J. Maul and K. Wittmaack
Surface Science 47 (1) 358 (1975)
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On a mechanism of secondary emission of polyatomic particles

P Joyes
Journal of Physics B: Atomic and Molecular Physics 4 (4) L15 (1971)
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Distributions énergétique et angulaire de l'émission ionique secondaire. III. Distribution angulaire et rendements ioniques

Jean-François Hennequin
Journal de Physique 29 (10) 957 (1968)
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Émission d'électrons Auger par les atomes d'une cible métallique soumise à un bombardement ionique

Jean-François Hennequin
Journal de Physique 29 (11-12) 1053 (1968)
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Étude théorique de l'émission ionique secondaire

Pierre Joyes
Journal de Physique 30 (4) 365 (1969)
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Émission ionique secondaire des alliages cuivre-aluminium en présence d'oxygène

D. Brochard and G. Slodzian
Journal de Physique 32 (2-3) 185 (1971)
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Évolution des rendements de l'émission ionique des alliages avec la nature du soluté - Première partie : Résultats expérimentaux

G. Blaise and G. Slodzian
Journal de Physique 35 (3) 237 (1974)
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Transmission d'un filtre de masse quadrupolaire. II. Calcul de la transmission globale d'un spectromètre quadrupolaire

R.-L. Inglebert and J.-F. Hennequin
Revue de Physique Appliquée 15 (9) 1489 (1980)
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Secondary Ion Mass Spectrometry SIMS V

J.-F. Hennequin, R.-L. Inglebert and P. Viaris de Lesegno
Springer Series in Chemical Physics, Secondary Ion Mass Spectrometry SIMS V 44 60 (1986)
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Inelastic Particle-Surface Collisions

R. Kelly
Springer Series in Chemical Physics, Inelastic Particle-Surface Collisions 17 292 (1981)
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