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Article cité :

Contribution of ion emission to sputtering of uranium dioxide by highly charged ions

S. Boudjadar, F. Haranger, T. Jalowy, et al.
The European Physical Journal D 32 (1) 19 (2005)
https://doi.org/10.1140/epjd/e2004-00150-y

H+ emission by MeV-ion impact: Charge state dependence of energy and angular distributions

M. Most, K. Wien, A. Brunelle, et al.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 168 (2) 203 (2000)
https://doi.org/10.1016/S0168-583X(99)00907-6

H+ secondary ion emission produced by pre-impact surface ionization

E.F. da Silveira and M. Matos
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 99 (1-4) 107 (1995)
https://doi.org/10.1016/0168-583X(95)00039-9

A plasma desorption mass spectrometry study of CHn+ and C2Hn+ ion formation from frozen organic surfaces

R.L. Betts, E.F. da Silveira and E.A. Schweikert
International Journal of Mass Spectrometry and Ion Processes 145 (1-2) 9 (1995)
https://doi.org/10.1016/0168-1176(95)04180-S

Coincidence counting analysis of secondary ions emitted from a phenylalanine target under multicharged MeV carbon bombardment

K.B. Ray, E.F. da Silveira, J.M.F. Jeronymo, et al.
International Journal of Mass Spectrometry and Ion Processes 136 (2-3) 107 (1994)
https://doi.org/10.1016/0168-1176(94)04045-1

Time-of-flight mass spectrometry using mega-electronvolt neutral beams

J.M.F. Jeronymo, E.F. da Silveira, R.R. Pinho, et al.
International Journal of Mass Spectrometry and Ion Processes 126 59 (1993)
https://doi.org/10.1016/0168-1176(93)80070-U

Emission of hydrogen ions under multiply charged ion bombardment

I. Bitensky, E. Parilis, S. Della-Negra and Y.Le Beyec
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 72 (3-4) 380 (1992)
https://doi.org/10.1016/0168-583X(92)95132-B

Secondary-ion emission from phenylalanine induced by atomic and molecular MeV ion beams

C. V. Barros Leite, E. F. da Silveira, J. M. F. Jeronymo, et al.
Physical Review B 45 (21) 12218 (1992)
https://doi.org/10.1103/PhysRevB.45.12218

A simple way to study secondary ion emission by heavy multicharged ions at medium energy (≃ 115 keV. Application to hydrogen ion emission

A. Brunelle, S. Della-Negra, J. Depauw, H. Joret and Y. Le Beyec
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 43 (4) 586 (1989)
https://doi.org/10.1016/0168-583X(89)90411-4

New measurements of the mean equilibrium charge of MeV/u heavy ions inside the cold matter with the H+emission probe

A. Brunelle, S. Della-Negra, J. Depauw, et al.
Radiation Effects and Defects in Solids 110 (1-2) 85 (1989)
https://doi.org/10.1080/10420158908214167

Desorption of secondary negative ions induced by impact of heavy ions near the bohr velocity

Mehran Salehpour, Jerry E. Hunt, Derry L. Fishel and James C. Tou
International Journal of Mass Spectrometry and Ion Processes 88 (2-3) 211 (1989)
https://doi.org/10.1016/0168-1176(89)85017-7

Desorption of valine molecular ions using fast incident atomic and polyatomic ions

Mehran Salehpour, Derry L. Fishel and Jerry E. Hunt
International Journal of Mass Spectrometry and Ion Processes 84 (3) R7 (1988)
https://doi.org/10.1016/0168-1176(88)80111-3

Variation of yield with thickness in SIMS and PDMS: Measurements of secondary ion emission from organized molecular films

G. Bolbach, R. Beavis, S.Della Negra, et al.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 30 (1) 74 (1988)
https://doi.org/10.1016/0168-583X(88)90082-1

Nonlinear effects in desorption of valine with fast incident molecular ions

Mehran Salehpour, Derry L. Fishel and Jerry E. Hunt
Physical Review B 38 (17) 12320 (1988)
https://doi.org/10.1103/PhysRevB.38.12320

Secondary ion emission induced by multicharged 18-keV ion bombardment of solid targets

S. Della-Negra, J. Depauw, H. Joret, Y. Le Beyec and E. A. Schweikert
Physical Review Letters 60 (10) 948 (1988)
https://doi.org/10.1103/PhysRevLett.60.948