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Article cité :
J. van der Rest , P. Pecheur
J. Phys. France, 44 11 (1983) 1297-1305
Citations de cet article :
14 articles
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Electrical behavior of fast neutron irradiated semi-insulating GaAs during thermal recovery
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Electronic structure of neutral and charged point defects. A charge self‐consistent empirical tight‐binding study
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Solid State Physics
Alex Zunger Solid State Physics 39 275 (1986) https://doi.org/10.1016/S0081-1947(08)60371-9
Charge Self‐Consistent Tight‐Binding Parameters. Application to III‐V Compound Semiconductors
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Festkörperprobleme 25
Eicke R. Weber and Pär Omling Advances in Solid State Physics, Festkörperprobleme 25 25 623 (1985) https://doi.org/10.1007/BFb0108198
Double anion antisite in GaAs - the simplest member of EL2 family?
T. Figielski, E. Kaczmarek and T. Wosiński Applied Physics A Solids and Surfaces 38 (4) 253 (1985) https://doi.org/10.1007/BF00616060
Chemical trends for deep antisite defect levels in III –V compounds
W. Pötz and D.K. Ferry Journal of Physics and Chemistry of Solids 46 (9) 1101 (1985) https://doi.org/10.1016/0022-3697(85)90026-5
Comparison between the spin polarization energies for VSi− in silicon and VGa0 in gallium phosphide
J. Van Der Rest Physics Letters A 100 (6) 286 (1984) https://doi.org/10.1016/0375-9601(84)90538-3
Charge states of the sulphur vacancy in ZnS
J. van der Rest and P. Pecheur Solid State Communications 50 (3) 269 (1984) https://doi.org/10.1016/0038-1098(84)90810-X
A tight-binding study of energy levels of iron in SrTiO3
M O Selme, P Pecheur and G Toussiant Journal of Physics C: Solid State Physics 17 (29) 5185 (1984) https://doi.org/10.1088/0022-3719/17/29/018