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Article cité :

Fluctuations and noise of hot carriers in semiconductor materials and devices

J.-P. Nougier
IEEE Transactions on Electron Devices 41 (11) 2034 (1994)
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Dynamical properties of a frustrated monolayer of Ar on MgO(100): A neutron-scattering study

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Theoretical study of the instability of a homeotropic nematic submitted to an elliptical shear

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