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Cited article:

Dislocations dynamics during the nonlinear creep of a homeotropic sample of smectic-A liquid crystal

P. Oswald and G. Poy
The European Physical Journal E 41 (6) (2018)
https://doi.org/10.1140/epje/i2018-11684-9

Dislocation motion controlled by interactions with crystal lattice: modelling and experiments

D. Caillard and J. L. Martin
International Materials Reviews 50 (6) 366 (2005)
https://doi.org/10.1179/174328005X67151

Defect dynamics in a smectic Grandjean-Cano wedge

Christophe Blanc, Nadia Zuodar, Ioannis Lelidis, Maurice Kleman and Jean-Luc Martin
Physical Review E 69 (1) (2004)
https://doi.org/10.1103/PhysRevE.69.011705

Characterization of Structural Quality of Bonded Silicon-On-Insulator Wafers by Spectroscopic Ellipsometry and Raman Spectroscopy

N. V. Nguyen, J. E. Maslar, Jin-Yong Kim, et al.
MRS Proceedings 809 (2004)
https://doi.org/10.1557/PROC-809-B8.19

Static and Dynamic Observations of Dislocations and Other Defects in Smectic Cano Wedges

I. Lelidis, M. Kléman and J. L. Martin
Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals 351 (1) 187 (2000)
https://doi.org/10.1080/10587250008023268

Dislocation Mobility in Smectic Liquid Crystals

I. Lelidis, M. Kléman and J. L. Martin
Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals 330 (1) 457 (1999)
https://doi.org/10.1080/10587259908025622

Dynamic behavior of oscillatory plastic flow in a smectic liquid crystal

Richard A. Herke, Noel A. Clark,1 and Mark A. Handschy
Physical Review E 56 (3) 3028 (1997)
https://doi.org/10.1103/PhysRevE.56.3028

Stress-induced Vortex Line Helixing Avalanches in the Plastic Flow of a Smectic A Liquid Crystal

Richard A. Herke, Noel A. Clark and Mark A. Handschy
Science 267 (5198) 651 (1995)
https://doi.org/10.1126/science.267.5198.651

Relationship between the physicochemical and electronic properties of sputtered hydrogenated amorphous silicon films: The effect of substrate temperature

D Jousse, J Saïd and J.P Stoquert
Thin Solid Films 124 (3-4) 191 (1985)
https://doi.org/10.1016/0040-6090(85)90265-2