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Multilayer high reflectance coating on polyethylene terephthalate film consisting of Ag/SiO2/TiO2 layers that are not quarter-wave thickness

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The Degradation of Optical Properties in a Sulfuric Acid Anodized Aluminum Coating System Exposed to Vacuum or Vacuum-Ultraviolet Radiation

X. Y. Sheng, D. L. Callahan and E. V. Barrera
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Optical Trappings of ThO2and UO2Particles Using Radiation Pressure of a Visible Laser Light

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Single-mode, optical-fiber sensors and tunable wavelength filters based on the resonant excitation of metal-clad modes

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G. A. Niklasson
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Solar absorptance and thermal emittance of Al2O3 films on Al: A theoretical assessment

T.S. Eriksson, A. Hjortsberg and C.G. Granqvist
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Physics of Thin Films - Advances in Research and Development

G. HASS, J.B. HEANEY and W.R. HUNTER
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Reflectance and preparation of front-surface mirrors for use at various angles of incidence from the ultraviolet to the far infrared

Georg Hass
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Effective medium models for the optical properties of inhomogeneous materials

G. A. Niklasson, C. G. Granqvist and O. Hunderi
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J. Thomas Cox and Georg Hass
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Infrared reflectance of silicon oxide and magnesium fluoride protected aluminum mirrors at various angles of incidence from 8 μm to 12 μm

J. T. Cox, G. Hass and W. R. Hunter
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Methods for Determining Film Thickness and Optical Constants of Films and Substrates

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Laboratory Experiments to Study Surface Contamination and Degradation of Optical Coatings and Materials in Simulated Space Environments

G. Hass and W. R. Hunter
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Reflectance, Solar Absorptivity, and Thermal Emissivity of SiO_2-Coated Aluminum

G. Hass, J. B. Ramsey, J. B. Heaney and J. J. Triolo
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Calculated Reflectance of Aluminum-Overcoated Iridium in the Vacuum Ultraviolet from 500 Å to 2000 Å

G. Hass and W. R. Hunter
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Further Studies on MgF_2-Overcoated Aluminum Mirrors with Highest Reflectance in the Vacuum Ultraviolet

L. R. Canfield, G. Hass and J. E. Waylonis
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Effect of Ultraviolet Irradiation on the Optical Properties of Silicon Oxide Films

A. P. Bradford, G. Hass, M. McFarland and E. Ritter
Applied Optics 4 (8) 971 (1965)
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