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Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
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Cited article:

Multiple-charged secondary-ion emission from silicon and silicon oxide bombarded by heavy ions at energies of 0.4–10 MeV

S. Kyoh, K. Takakuwa, M. Sakura, et al.
Physical Review A 51 (1) 554 (1995)
https://doi.org/10.1103/PhysRevA.51.554

Determination of the concentration and stable isotopic composition of nonexchangeable hydrogen in organic matter

Arndt. Schimmelmann
Analytical Chemistry 63 (21) 2456 (1991)
https://doi.org/10.1021/ac00021a013

Quantitative surface analysis of organic polymer blends using a time-of-flight static secondary ion mass spectrometer

Patrick M. Thompson
Analytical Chemistry 63 (21) 2447 (1991)
https://doi.org/10.1021/ac00021a012

A quantitative test of the kinetic model of secondary ion emission

Robert A. Weller
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 40-41 286 (1989)
https://doi.org/10.1016/0168-583X(89)90980-4

Secondary Ion Mass Spectrometry SIMS V

J.-F. Hennequin, R.-L. Inglebert and P. Viaris de Lesegno
Springer Series in Chemical Physics, Secondary Ion Mass Spectrometry SIMS V 44 60 (1986)
https://doi.org/10.1007/978-3-642-82724-2_13

Secondary ion emission: the role of the angular resolved energy spectrum

A. Oliva and G. Falcone
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 13 (1-3) 377 (1986)
https://doi.org/10.1016/0168-583X(86)90532-X

A comparison of secondary ion emission from polycrystalline metals under MeV and keV heavy ion bombardment

John P. O'Connor, Patricia G. Blauner and Robert A. Weller
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 7-8 768 (1985)
https://doi.org/10.1016/0168-583X(85)90466-5

On the kinetic energies of sputtered excited particles, I. Atoms sputtered from Li, LiF, and NaCl

Steven Dzioba, Orlando Auciello and Roger Kelly
Radiation Effects 45 (3-4) 235 (1980)
https://doi.org/10.1080/00337578008208435

Critical investigation of the secondary ion emission of pure metals using the pseudoatom method

J. Antal and S. Kugler
Acta Physica Academiae Scientiarum Hungaricae 49 (4) 351 (1980)
https://doi.org/10.1007/BF03157401

Transmission d'un filtre de masse quadrupolaire. II. Calcul de la transmission globale d'un spectromètre quadrupolaire

R.-L. Inglebert and J.-F. Hennequin
Revue de Physique Appliquée 15 (9) 1489 (1980)
https://doi.org/10.1051/rphysap:019800015090148900

Secondary ion energy spectra of polycrystalline transition metals and aluminium

K.J. Snowdon and R.J. MacDonald
International Journal of Mass Spectrometry and Ion Physics 28 (3) 233 (1978)
https://doi.org/10.1016/0020-7381(78)80089-8

Dependence of the energy distribution on the emission angle for the secondary ions from polycrystalline aluminum

K. Komori and J. Okano
International Journal of Mass Spectrometry and Ion Physics 27 (4) 379 (1978)
https://doi.org/10.1016/0020-7381(78)80045-X

Vaporization Thermodynamics and Molecular Sputtering of Binary Targets

Dieter M. Gruen, Patricia A. Finn and Dennis L. Page
Nuclear Technology 29 (3) 309 (1976)
https://doi.org/10.13182/NT76-A31595

Secondary-ion emission during bombardment of copper and aluminium single crystals with alkali ions

K. Kerkow and M. Trapp
International Journal of Mass Spectrometry and Ion Physics 13 (2) 113 (1974)
https://doi.org/10.1016/0020-7381(74)80016-1

Évolution des rendements de l'émission ionique des alliages avec la nature du soluté - Première partie : Résultats expérimentaux

G. Blaise and G. Slodzian
Journal de Physique 35 (3) 237 (1974)
https://doi.org/10.1051/jphys:01974003503023700

Implications in the use of secondary ion mass spectrometry to investigate impurity concentration profiles in solids

F. Schulz, K. Wittmaack and J. Maul
Radiation Effects 18 (3-4) 211 (1973)
https://doi.org/10.1080/00337577308232124

A low background secondary ion mass spectrometer with quadrupole analyser

K. Wittmaack, J. Maul and F. Schulz
International Journal of Mass Spectrometry and Ion Physics 11 (1) 23 (1973)
https://doi.org/10.1016/0020-7381(73)80052-X

Ion—ion emission — A new tool for mass-spectrometric investigations of processes on the surface and in the bulk of solids

Ya.M. Fogel'
International Journal of Mass Spectrometry and Ion Physics 9 (2) 109 (1972)
https://doi.org/10.1016/0020-7381(72)80037-8

Processus de formation d'ions à partir d'atomes éjectés dans des états électroniques surexcités lors du bombardement ionique des métaux de transition

G. Blaise and G. Slodzian
Journal de Physique 31 (1) 93 (1970)
https://doi.org/10.1051/jphys:0197000310109300

Distributions énergétique et angulaire de l'émission ionique secondaire. III. Distribution angulaire et rendements ioniques

Jean-François Hennequin
Journal de Physique 29 (10) 957 (1968)
https://doi.org/10.1051/jphys:019680029010095700