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Article cité :
M. Gadenne , J. Lafait
J. Phys. France, 47 8 (1986) 1405-1410
Citations de cet article :
11 articles
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Relation between superparamagnetic relaxation and optical properties
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Characterization of polyacrylonitrile films grafted onto nickel by ellipsometry, atomic force microscopy and X-ray reflectivity
C. Calberg, M. Mertens, R. Jérôme, et al. Thin Solid Films 310 (1-2) 148 (1997) https://doi.org/10.1016/S0040-6090(97)00406-9
Far infrared optical properties of ferromagnetic cermets
M. Gadenne, J. Plon, P. Gadenne and P. Sheng Optics Communications 107 (5-6) 373 (1994) https://doi.org/10.1016/0030-4018(94)90350-6
Optical properties of polycrystalline and amorphous Ni1?xPx layers by ellipsometry
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Transmittance of thin metal films near the percolation threshold
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