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Elementary Processes in Excitations and Reactions on Solid Surfaces
K. Makoshi and T. Mii Springer Series in Solid-State Sciences, Elementary Processes in Excitations and Reactions on Solid Surfaces 121 157 (1996) https://doi.org/10.1007/978-3-642-61185-8_16
Effect of the local electronic temperature on secondary-ion spectra
A systematic study of the characteristic velocities of the negative secondary ion emissions of H, O and matrix species from Sc, Ti, V, Co, Ni and Cu substrates
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Hongxiao Shao, Peter Nordlander and David C. Langreth Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 100(2-3) 260 (1995) https://doi.org/10.1016/0168-583X(94)00822-1
Charge-transfer processes in atom-surface collisions at low energies: a Green's function approach
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Time-dependent transport in interacting and noninteracting resonant-tunneling systems
Charge state of atomic particles ejected from solid surfaces: influence of initial conditions
D. Klushin, M. Gusev and I. Urazgil'din Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 90(1-4) 542 (1994) https://doi.org/10.1016/0168-583X(94)95610-3
Wide-band approximation in the theories of charge transfer during ion-surface scattering
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Z. Sroubek, G. Falcone, D. Aiello and C. Attanasio Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 88(4) 365 (1994) https://doi.org/10.1016/0168-583X(94)95385-6
Variations in the value of the characteristic velocity of the Zr− secondary ion emissions across the oxide/metal interface
P.A.W. van der Heide Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 93(4) 421 (1994) https://doi.org/10.1016/0168-583X(94)95629-4
Negative‐ion production probability in rf plasma sputter‐type heavy negative‐ion sourcea)
Hiroshi Tsuji, Junzo Ishikawa, Yasuyuki Kawabata and Yasuhito Gotoh Review of Scientific Instruments 65(5) 1732 (1994) https://doi.org/10.1063/1.1145233
On the secondary ion emission probability in the presence of Fermi sea excitations due to dynamical screening; application to C60
P. Joyes Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 88(1-2) 49 (1994) https://doi.org/10.1016/0168-583X(94)96079-8
The infinite velocity method: A new method for SIMS quantification
P. A. W. Van Der Heide, Min Zhang, G. R. Mount and N. S. McIntyre Surface and Interface Analysis 21(11) 747 (1994) https://doi.org/10.1002/sia.740211103
Contribution of the Landau-Zener-Stueckelberg model to the understanding of positive secondary-ion emission
Yoshiharu Mori Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 328(1-2) 146 (1993) https://doi.org/10.1016/0168-9002(93)90616-P
Scattering of atoms by surfaces within a molecular orbital approach
Intra-atomic correlation effects in charge transfer
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The model of secondary atom excited states formation
V.G. Drobnich and S.Yu. Medvedev Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 78(1-4) 148 (1993) https://doi.org/10.1016/0168-583X(93)95792-4
A model description of ionization processes during secondary ion emission
I.F. Urazgil'din Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 78(1-4) 271 (1993) https://doi.org/10.1016/0168-583X(93)95810-R
Chemical effects in secondary ion emission from metal surfaces
Ion sources for accelerators in materials research
G.D. Alton Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 73(2) 221 (1993) https://doi.org/10.1016/0168-583X(93)95738-Q
Formation of localized states and electronic excitation in solids during low-energy particle bombardment
Z. S̆roubek Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 78(1-4) 140 (1993) https://doi.org/10.1016/0168-583X(93)95790-C
Ability of secondary-ion mass spectrometry to study the growth mode of a deposit on a substrate: Case of cobalt deposition on (100) copper surfaces
Multiple-center effects in the stopping power of slow clusters
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Charge exchange in many-body time-dependent processes
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Orthogonality exponent and the friction coefficient of an electron gas
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Formulation of the laser assisted resonant and auger processes in slow collisions of atoms (ions) on metal surfaces
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Analytic approach to charge transfer during atom-surface scattering
The sputter-generation of negative ion beams: Analytical modeling
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Détermination du travail de sortie par comparaison des distributions énergétiques des ions secondaires