Articles citing this article

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Cited article:

Singly- and doubly-negative carbon clusters in sputtering: Energy spectra, abundance distributions and unimolecular fragmentation

Hubert Gnaser
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 149 (1-2) 38 (1999)
https://doi.org/10.1016/S0168-583X(98)00756-3

A comparison of ion-induced electron emission and secondary ion yields

R. H. Milne, E. A. Maydell and D. J. Fabian
Applied Physics A Solids and Surfaces 52 (3) 197 (1991)
https://doi.org/10.1007/BF00324418

A quantitative test of the kinetic model of secondary ion emission

Robert A. Weller
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 40-41 286 (1989)
https://doi.org/10.1016/0168-583X(89)90980-4

Secondary-ion emission from clean and oxidized aluminum as a function of incident ion mass and energy

Patricia G. Blauner and Robert A. Weller
Physical Review B 35 (4) 1492 (1987)
https://doi.org/10.1103/PhysRevB.35.1492

Auger electron emission from the decay of collisionally-excited atoms sputtered from Al and Si

T.D. Andreadis, Joseph Fine and J.A.D. Matthew
Nuclear Instruments and Methods in Physics Research 209-210 495 (1983)
https://doi.org/10.1016/0167-5087(83)90844-X

Spectres auger et sections efficaces d'ionisation de la couche L23 du magnésium et de l'aluminium sous impact de protons et d'ions lourds (10–100 keV)

Claude Benazeth, Nicole Benazeth and Louis Viel
Surface Science 78 (3) 625 (1978)
https://doi.org/10.1016/0039-6028(78)90237-6

Émission d'électrons Auger par bombardement ionique mécanisme et possibilité d'application à l'analyse des surfaces

P. Viaris De Lesegno and J.-F. Hennequin
Revue de Physique Appliquée 12 (6) 927 (1977)
https://doi.org/10.1051/rphysap:01977001206092700

Study of non-radiative silicon deexcitation in an oxygen atmosphere using the differential measurement of the excited state lifetimes

J. Azencot and R. Goutte
Applied Physics 14 (3) 303 (1977)
https://doi.org/10.1007/BF00882736

Untersuchungen zur kinetischen ionen-elektronen-emission von halbleiteroberflächen beim beschuss mit positiven edelgasionen im energiebereich 2–25 keV

P. Gaworzewski, K.H. Krebs and M. Mai
International Journal of Mass Spectrometry and Ion Physics 13 (2) 99 (1974)
https://doi.org/10.1016/0020-7381(74)80015-X

Distribution d'énergie des électrons secondaires émis par InP et GaP soumis à un bombardement d'ions Ar+ de 40 keV

Claude Benazeth, Louis Viel and Nicole Colombie
Surface Science 32 (3) 618 (1972)
https://doi.org/10.1016/0039-6028(72)90189-6

Secondary electron spectra of some solid targets under ionic bombardment

F. Louchet, L. Viel, C. Benazeth, B. Fagot and N. Colombie
Radiation Effects 14 (1-2) 123 (1972)
https://doi.org/10.1080/00337577208230482

Processus de formation d'ions à partir d'atomes éjectés dans des états électroniques surexcités lors du bombardement ionique des métaux de transition

G. Blaise and G. Slodzian
Journal de Physique 31 (1) 93 (1970)
https://doi.org/10.1051/jphys:0197000310109300