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Article cité :
P. Bousquet
J. Phys. France, 25 1-2 (1964) 50-54
Citations de cet article :
18 articles
Handbook of Optical Constants of Solids
I. OHLÍDAL and K. NAVRÁTILhttps://doi.org/10.1016/B978-0-08-055630-7.50061-4
Handbook of Optical Constants of Solids
I. Ohlídal and K. Navrátilhttps://doi.org/10.1016/B978-012544415-6.50092-3
Comparison of interferometrical and stylus step height measurements on rough surfaces
U Brand6 (3) 81 (1995)https://doi.org/10.1088/0957-4484/6/3/002
Calibration of step height standards for nanometrology using interference microscopy and stylus profilometry
U. Brand and W. Hillmann17 (1) 22 (1995)https://doi.org/10.1016/0141-6359(94)00003-I
Optical properties of In2O3−SnO2 films in the transparent and plasma reflection region
J. Szczyrbowski, K. Schmalzbauer and H. Hoffmann137 (2) 169 (1986)https://doi.org/10.1016/0040-6090(86)90017-9
Optical properties of rough thin films
J. Szcyrbrowski, K. Schmalzbauer and H. Hoffmann130 (1-2) 57 (1985)https://doi.org/10.1016/0040-6090(85)90296-2
A comparison of optical and nuclear methods for the measurement of the thickness of thin metal foils
K. Muskalla, Th. Pfeiffer and W. Möller76 (3) 259 (1981)https://doi.org/10.1016/0040-6090(81)90696-9
Light scattering investigation of the nature of polished glass surfaces
P Croce and L Prod'homme7 (2) 121 (1976)https://doi.org/10.1088/0335-7368/7/2/307
Estimate of the effect of unevenness of surface layers on the optical properties of thin-layer coatings
I. M. Minkov25 (3) 1170 (1976)https://doi.org/10.1007/BF00618038
Rough silicon surfaces studied by optical methods
I. Ohlidal, F. Lukeš and K. Navràtil45 (1) 91 (1974)https://doi.org/10.1016/0039-6028(74)90157-5
Reflection of light on a system of non-absorbing isotropic film-non-absorbing isotropic substrate with rough boundaries
I. Ohlídal, K. Navrátil and F. Lukeš3 (1) 40 (1971)https://doi.org/10.1016/0030-4018(71)90210-0
Reflection of Light by a System of Nonabsorbing Isotropic Film–Nonabsorbing Isotropic Substrate with Randomly Rough Boundaries
I. Ohlídal, K. Navrátil and F. Lukeš61 (12) 1630 (1971)https://doi.org/10.1364/JOSA.61.001630
Structure et propriétés optiques de couches minces de trioxyde d'antimoine
N. Le Gaillard6 (5) 289 (1970)https://doi.org/10.1016/0040-6090(70)90079-9
Thin film surface studies by X-ray reflection
P. Croce, G. Devant, M.G. Sere and M.F. Verhaeghe22 (1) 173 (1970)https://doi.org/10.1016/0039-6028(70)90032-4
Intermetallic Semiconducting Films
Intermetallic Semiconducting Films 343 (1970)https://doi.org/10.1016/B978-0-08-013367-6.50013-2
Nouveau procédé d'observation du profil et de l'état des surfaces par microscopie électronique; applications à l'optique
P. Bousquet, L. Capella, A. Fornier and J. Gonella8 (6) 1229 (1969)https://doi.org/10.1364/AO.8.001229
Quelques Résultats Récents Concernant les Techniques de Préparation et L'étude Optique des Couches Minces Solides
P. Rouard and P. Bousquet16 (6) 675 (1969)https://doi.org/10.1080/713818229
Der einfluss von strukturunregelmässigkeiten beim zusammenwachsen zweier aufdampfschichten auf das schichtdickenmessverfahren mit hilfe von vielstrahl-interferenzen
Karl-Joseph Hanszen2 (5-6) 509 (1968)https://doi.org/10.1016/0040-6090(68)90064-3
