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Molecular beam epitaxy of Pd-Fe graded alloy films for standing spin waves control

Igor Yanilkin, Amir Gumarov, Igor Golovchanskiy, Airat Kiiamov, Bulat Gabbasov, Roman Yusupov and Lenar Tagirov
Journal of Vacuum Science & Technology A 42 (5) (2024)
https://doi.org/10.1116/6.0003721

Characterization of inhomogeneous optical interference films using a complex parabolic profile model

M Montecchi
Pure and Applied Optics: Journal of the European Optical Society Part A 4 (6) 831 (1995)
https://doi.org/10.1088/0963-9659/4/6/012

Thickness and model optimization in characterization of optical interference films by using discontinuities of n(lambda) solutions

M Montecchi, E Masetti and G Emiliani
Pure and Applied Optics: Journal of the European Optical Society Part A 4 (1) 15 (1995)
https://doi.org/10.1088/0963-9659/4/1/003

Homogeneously mixed dielectric films as double-layer antireflection coatings

R. Hradaynath, K. N. Chopra and O. P. Grover
Applied Optics 18 (3) 328 (1979)
https://doi.org/10.1364/AO.18.000328

Triple-layer broad band antireflection coatings using homogeneously mixed dielectric coatings

K.N. Chopra, S.K. Manchanda and R. Hradaynath
Thin Solid Films 55 (1) 49 (1978)
https://doi.org/10.1016/0040-6090(78)90072-X

Apparatus for the controlled co-deposition of MnBi thin films

D King, R C F Heyworth and G R Hoffman
Journal of Physics E: Scientific Instruments 6 (1) 86 (1973)
https://doi.org/10.1088/0022-3735/6/1/041

Factors influencing the accuracy of a quartz-crystal oscillator as a thickness monitor for thin-film deposition

H. K. Pulker and W. Schädler
Il Nuovo Cimento B Series 10 57 (1) 19 (1968)
https://doi.org/10.1007/BF02710309