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A simple method for measuring the thickness a and refraction index of transparent films without impairing them.
Une technique simple pour mesurer l'épaisseur et l'indice de réfraction de couches transparentes sans les altérer

W.A. Pliskin, E.E. Conrad

J. Phys. France, 25 1-2 (1964) 17-20

DOI: https://doi.org/10.1051/jphys:01964002501-201700

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Citations de cet article :

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